In our electronic loads, the field-effect-transistor (FET) converts power to heat to consume it.
Therefore, power is dissipated by heat.
With this method, our electronic loads can flexibly and quickly control the load current so that they are suitable for testing with rapid current fluctuations.
However, heat must be exhausted.
If the test requires a long continuous operation or your DUT has a large power capacity, you may need a heat exhaust system (e.g., air conditioner).
